Day 1: Monday 10 September: Tutorials

08.45-09.00: welcome and introductory remarks (Henk Vrielinck)
09.00-10.00: Defects in semiconductors: basic definitions and structural properties
       (Cor Claeys)
10.00-10.30: coffee break
10.30-11.30: Defects in semiconductors: electrical properties (Henk Vrielinck)
11.30-12.30: Transmission electron microscopy as a characterisation tool for semiconductor
       devices (Giulio Guzzinati)
12.30-14.00: lunch
14.00-15.00: Basics of semiconductor devices (Eddy Simoen)
15.00-16.00: Basics processing steps Part I (Rita Rooyackers)
16.00-16.30: coffee break
16.30-17.30: Basic processing steps Part II (Rita Rooyackers)